Service/Product Name: |
Nanoscale diagnostics of morphological, electrical, and mechanical properties of surfaces using scanning probe microscopy techniques. |
Brief Description of the Service/Product: |
Atomic force microscopy (AFM) and spectroscopy; |
Available Equipment and Personnel for Service Provision/Product Manufacturing: |
|
Certification of Equipment and Instruments |
Certificate of metrological certification of the surface geometric parameters measurement laboratory of the Institute for Nanomaterials Science (IFN NASU) (No. PT-516/12 issued on December 28, 2012, by the State Enterprise "Ukrmetrteststandard"). Scope of certification: geometric dimensions of individual surface elements, surface roughness of surface fragments in the sub-nanometer, sub-micron, and micron measurement ranges. |
Availability of Intellectual Property Protection Documents and Their Validity |
Absent. |
Approximate Price of the Service/Product |
Price: Negotiable |
Problems Addressed by This Service/Product |
Comprehensive diagnostics of geometric and physical properties of surfaces in the size range from fractions of a nanometer to several micrometers. |
Potential Consumers of This Service/Product by Industries and Enterprises |
Enterprises with high-tech manufacturing in various industries (including precision manufacturing, pharmaceutical companies), academic and industry institutes, higher education institutions, private organizations, and entrepreneurs. |
Approximate Timeframes for Service/Product Completion a) For Prototype Sample: |
From 1 working day. |